Effects of uniaxial stress on the electroreflectance spectrum of Ge and GaAs
- 15 February 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 15 (4) , 2127-2144
- https://doi.org/10.1103/physrevb.15.2127
Abstract
We have investigated the effects of static uniaxial compression along [001] and [111] on the Schottky-barrier electroreflectance spectrum of the and transitions in Ge and GaAs. From the stress-induced splittings and shifts of these optical structures we have obtained deformation potentials, spin-exchange parameters and reduced interband masses. For the transitions orbital ( and ), spin-dependent ( and ), and hydrostatic deformation potentials have been determined. In GaAs these are the first measurements reported for and . The other parameters were found to be in good agreement with previous works. Interband reduced masses for the transition in Ge were determined at high stresses, in which case the degenerate valence band is split and the constant-energy surfaces are parabolic. Conclusive evidence for the existence of the electron-hole Coulomb interaction at 300°K as well as 77°K in the transitions has been obtained from the polarization-dependent stress-induced splittings for [001] stress. The observed splitting is not explained by one-electron theory but is accounted for by including the electron-hole exchange interaction. By including exciton effects at 300°K the systematic discrepancy between theory and experiment for the intensity and line shape of this structure should be resolved. In addition, deformation potentials due to shear (), hydrostatic (), and intraband () effects were determined for the transitions. The values obtained for in GaAs and Ge were found to be almost a factor of 2 larger than those previously reported. The reason for this is believed to be the higher resolution of the present experiments. Other parameters agree with prior works.
Keywords
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