Detection of failures in combinational digital circuits

1 January 1971

journal article
Published by Institution of Engineering and Technology (IET) in Proceedings of the Institution of Electrical Engineers

Vol. 118 (5) , 643-648
https://doi.org/10.1049/piee.1971.0115

Abstract

The paper is concerned with the problem of determining, by terminal experiments, whether a given combinational switching circuit operates correctly or whether it is impaired by some malfunction. We shall be primarily concerned with permanent faults due to component failures. It is assumed that other procedures will be employed to protect the circuit against the effects of transient faults. A method is presented for the detection of failures in combinational switching circuits. The method provides minimal sets of tests for 2-level circuits and nearly minimal sets of tests for multilevel circuits.

Keywords

MINIMAL TEST SET
2-LEVEL CIRCUIT
MULTILEVEL CIRCUITS TESTING
PERMANENT FAULT
COMPONENTS FAULT
FAILURE DETECTION
SWITCHING CIRCUITS
TRANSIENT FAULT PROTECTION
TERMINAL EXPERIMENTS
COMBINATIONAL DIGITAL CIRCUITS
OPERATION

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