Morphological stability and compositional uniformity of alloy thin films

This publication has 47 references indexed in Scilit:

• Some general properties of stress-driven surface evolution in a heteroepitaxial thin film structure
  Journal of the Mechanics and Physics of Solids, 1994
• Two-dimensional islanding atop stressed solid helium and epitaxial films
  Physical Review B, 1994
• The Influence of Mass Forces on the Critical Thickness of Pre-Stressed He ⁴ and Solid Epitaxial Films
  Europhysics Letters, 1993
• Morphological instability in epitaxially strained dislocation-free solid films: Linear stability theory
  Journal of Applied Physics, 1993
• Kinetically controlled critical thickness for coherent islanding and thick highly strained pseudomorphic films of ${\mathrm{In}}_{\mathit{x}}$${\mathrm{Ga}}_{1\mathrm{-}\mathit{x}}$As on GaAs(100)
  Physical Review B, 1992
• Morphological instability in epitaxially strained dislocation-free solid films
  Physical Review Letters, 1991
• A boundary perturbation analysis for elastic inclusions and interfaces
  International Journal of Solids and Structures, 1991
• On the stability of surfaces of stressed solids
  Acta Metallurgica, 1989
• Interface morphology development during stress corrosion cracking—II. Via volume diffusion
  Acta Metallurgica, 1975
• Interface morphology development during stress corrosion cracking: Part I. Via surface diffusion
  Metallurgical Transactions, 1972