The frequency and temperature dependence of noise in YBa2Cu3O7 multijunction flux-flow amplifiers
- 1 September 1995
- journal article
- letter
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 78 (5) , 3537-3539
- https://doi.org/10.1063/1.359993
Abstract
Measurements of the absolute noise power of high Tc multijunction flux‐flow amplifiers in the frequency range 0.1 Hz–60 kHz are reported. The noise is found to have maxima at the operating points corresponding to optimum transresistance and gain, and is consistent with existing models of critical current fluctuations as found in single grain boundary junctions. The frequency dependence of the noise power is usually close to 1/f, although a Lorentzian term is sometimes observed. The normalized values of measured critical current fluctuations are approximately temperature independent as previously found for single junctions prepared by similar techniques.This publication has 8 references indexed in Scilit:
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