Spectrally-resolved white-light interferometry as a profilometry tool
- 1 October 1996
- journal article
- Published by Elsevier in Optics & Laser Technology
- Vol. 28 (7) , 485-489
- https://doi.org/10.1016/s0030-3992(96)00018-7
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Refractometry of liquid samples with spectrally resolved white light interferometryMeasurement Science and Technology, 1990
- Construction of an interferometric gauge system for thickness measurement in white lightOptics & Laser Technology, 1978