The weak-beam method in electron microscopy

This publication has 10 references indexed in Scilit:

• The weak-beam method in electron microscopy. I. Theoretical analysis
  Physica Status Solidi (a), 1973
• APPLICATIONS AND RECENT DEVELOPMENTS IN TRANSMISSION ELECTRON MICROSCOPY
  Published by University of California Press ,1972
• A Theoretical Analysis of the Weak-beam Method of Electron Microscopy
  Zeitschrift für Naturforschung A, 1972
• The critical voltage effect in high voltage electron microscopy
  Philosophical Magazine, 1972
• The dissociation of dislocations in silicon
  Proceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1971
• The weak beam technique as applied to the determination of the stacking-fault energy of copper
  Philosophical Magazine, 1971
• Investigations of dislocation strain fields using weak beams
  Philosophical Magazine, 1969
• Absorption parameters in electron diffraction theory
  Philosophical Magazine, 1968
• HFS atomic scattering factors
  Acta Crystallographica, 1964
• The analytical representation of atomic scattering amplitudes for electrons
  Acta Crystallographica, 1962