Ni-C multilayer reflectivity and photoelectron yield in the NiL-edge region
- 13 October 1986
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 49 (15) , 914-916
- https://doi.org/10.1063/1.97482
Abstract
We analyze measurements of the x‐ray reflectivity and photoelectron yield of a Ni‐C multilayer (103 layers; d=31 Å) in the NiL‐edge region (700–950 eV). The measured reflectivity is shown to be consistent with the one calculated using x‐ray scattering factors f1 and f2 for Ni as obtained from the photoelectron yield (∼f2). The analysis yields a new set of ‘‘effective’’ values for f1 in the NiL‐edge region.Keywords
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