Measurements of Fast Time Evolutions of Plasma Potential Using Emissive Probe
- 1 January 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (1R) , 148-151
- https://doi.org/10.1143/jjap.22.148
Abstract
We present a new method of measuring the floating potential of an emissive probe when the floating potential is very close to the plasma potential. The probe potential at which the probe current becomes zero in the current-voltage curve of the probe is automatically biased by a new probe circuit connected to a bipolar voltage source. This method enables direct measurement of rapid changes in the floating potential with a time resolution of ≃1 µs, giving a continuous data trace. The method was verified experimentally using a DP machine.Keywords
This publication has 10 references indexed in Scilit:
- Dynamics of a Potential Barrier Formed on the Tail of a Moving Double Layer in a Collisionless PlasmaPhysical Review Letters, 1982
- An Influence of a Heating Voltage on an Emissive Probe Characteristic in a PlasmaJournal of the Physics Society Japan, 1981
- A method for measuring fast time evolutions of the plasma potential by means of a simple emissive probeJournal of Physics E: Scientific Instruments, 1981
- Potential measurements by an emissive probe in a magnetized plasmaPhysics Letters A, 1980
- Determination of the electric field in plasmas with turbulencePhysics Letters A, 1979
- Laboratory double layersPhysics of Fluids, 1979
- Inflection-point method of interpreting emissive probe characteristicsReview of Scientific Instruments, 1979
- Electrostatic Probe Measurements in a Collisionless Plasma SheathPhysics of Fluids, 1971
- Plasma Potential Measurements by Electron Emissive ProbesReview of Scientific Instruments, 1966
- Electrical Discharges in Gases Part II. Fundamental Phenomena in Electrical DischargesReviews of Modern Physics, 1931