Simple Analytical Methods for Determining Optical Constants of Thin Films–Their Application to Amorphous Silicon–
- 1 March 1981
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 20 (3)
- https://doi.org/10.1143/jjap.20.675
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Physics of Thin FilmsPublished by Springer Nature ,1977