Linear imaging in scanning polarisation/interference contrast microscopy
- 25 September 1986
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 22 (20) , 1079-1081
- https://doi.org/10.1049/el:19860740
Abstract
The theory and design of a linear polarisation/interference contrast microscope are described. The operation of the technique is based on the use of a sinusoidally driven electro-optic phase modulator. The expected sensitivity of the system in detecting phase variations is 5 × 10-7 rad, in a 10Hz bandwidth. Experimental results are presented on the imaging of magnetic domains, which clearly demonstrate the sensitivity superiority of linear operation.Keywords
This publication has 0 references indexed in Scilit: