Microdiffraction, stem imaging and ELS at crystal surfaces
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 9 (3) , 231-236
- https://doi.org/10.1016/0304-3991(82)90205-4
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
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- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981
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- Surface imaging using diffracted electronsSurface Science, 1976
- Reflection and transmission of electrons through surface potential barriersSurface Science, 1964