Reliability testing and screening: A general review paper

• 1 January 1978
• journal article
• Published by Elsevier in Microelectronics Reliability
• Vol. 17  (3) , 367-377
• https://doi.org/10.1016/0026-2714(78)91314-8

Abstract

Keywords

• RELIABILITY TESTING
• SCREENING
• GENERAL REVIEW PAPER