On the Probability of Fault Occurrence

This publication has 3 references indexed in Scilit:

• Characterizing the LSI Yield Equation from Wafer Test Data
  IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
• Fault coverage requirement in production testing of LSI circuits
  IEEE Journal of Solid-State Circuits, 1982
• Defect Level as a Function of Fault Coverage
  IEEE Transactions on Computers, 1981