Application of spectroscopic ellipsometry to study the effect of surface treatments on cadmium telluride films
- 31 October 1988
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 164, 265-268
- https://doi.org/10.1016/0040-6090(88)90147-2
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Type conversion, contacts, and surface effects in electroplated CdTe filmsJournal of Applied Physics, 1985
- Properties of Hg0.71Cd0.29Te and some native oxides by spectroscopic ellipsometryJournal of Applied Physics, 1983
- Low resistance contacts to p-type cadmium tellurideJournal of Electronic Materials, 1982