Optical Properties of High‐Refractory Disilicide Thin Films
- 1 January 1989
- journal article
- research article
- Published by Wiley in Physica Status Solidi (b)
- Vol. 151 (1) , 375-382
- https://doi.org/10.1002/pssb.2221510142
Abstract
Optical reflectivity spectra are measured for TiSi2, TaSi2, and WSi2 thin films in the spectral range from 0.05 to 6 eV. The optical constants are obtained by Kramers‐Kronig analysis. The spectra are characterized by two spectral regions: the low‐energy free‐carrier response and the interband part. The spectra are discussed on the basis of presently existing band structure information and bonding trend calculations.Keywords
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