Spatial mapping of electrically active defects in HgCdTe using laser beam-induced current

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Abstract
A high-resolution and nondestructive optical characterization technique called laser beam-induced current (LBIC) has been developed and utilized to obtain maps of electrically active defects in liquid phase epitaxy HgCdTe. The LBIC technique is also suitable for studying the p–n junction detector elements in an array nondestructively, without requiring any electrical contacts to individual detector elements.

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