Transmittance Measurements with an Interference Microscope
- 1 May 1960
- journal article
- research article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 50 (5) , 477-482
- https://doi.org/10.1364/josa.50.000477
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
- Optimum Half-Shade Angle in Polarizing InstrumentsJournal of the Optical Society of America, 1959
- Half-Shade Eyepieces for the AO Baker Interference Microscope*Journal of the Optical Society of America, 1959
- Achromatic Combinations of Half-Wave PlatesJournal of the Optical Society of America, 1959
- Compensateur Biréfringent à Grand ChampOptica Acta: International Journal of Optics, 1955
- Abbildendes Interferometer f r Phasen- und AmplitudenmessungThe European Physical Journal A, 1955
- Polarization Effects in Photomultiplier Tubes*Journal of the Optical Society of America, 1952
- Optical Compensators for Measurement of Elliptical PolarizationJournal of the Optical Society of America, 1948
- A Photoelectric Method for the Determination of the Parameters of Elliptically Polarized LightJournal of the Optical Society of America, 1937