Tracer diffusion in amorphous Pd80Si20 and Gd16Co84 films
- 1 April 1982
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 90 (2) , 131-137
- https://doi.org/10.1016/0040-6090(82)90632-0
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
- The kinetics of structural relaxation of a metallic glassActa Metallurgica, 1980
- Diffusion and structural relaxation in compositionally modulated amorphous metal filmsApplied Physics Letters, 1980
- On the stability of vacancy and vacancy clusters in amorphous solidsPhilosophical Magazine A, 1979
- Structural imperfections in amorphous metalsJournal of Non-Crystalline Solids, 1978
- Diffusion in a Pd-Cu-Si metallic glassApplied Physics Letters, 1978
- TEM observation on the source of perpendicular anisotropy in amorphous GdCo(O2)Physica Status Solidi (a), 1977
- Diffusion in the Amorphous Phase of Pd-19-at.%-Si Metallic AlloyPhysical Review Letters, 1975