In situ ToF‐SIMS/XPS investigation of nitrogen plasma‐modified polystyrene surfaces
- 1 May 1994
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 21 (5) , 274-282
- https://doi.org/10.1002/sia.740210503
Abstract
No abstract availableKeywords
This publication has 39 references indexed in Scilit:
- Remote nitrogen plasma treatment of polymers: Polyethylene, nylon 6,6, poly(ethylene vinyl alcohol), and poly(ethylene terephthalate)Journal of Polymer Science Part A: Polymer Chemistry, 1992
- XPS and SSIMS analysis of polymers: The effect of remote nitrogen plasma treatment on polyethylene, poly(ethylene vinyl alcohol) and poly(ethylene terephthalate)Surface and Interface Analysis, 1991
- Modification of polypropylene surfaces by flame treatmentSurface and Interface Analysis, 1991
- Static Secondary Ion Mass Spectrometry and X-Ray Photoelectron Spectroscopy of Deuterium- and Methyl-Substituted PolystyreneApplied Spectroscopy, 1991
- Modification of polymer surfaces by two‐step plasma sensitized reactionsJournal of Polymer Science Part A: Polymer Chemistry, 1990
- Interaction of nitrogen and ammonia plasmas with polystyrene and polycarbonate studied by X-ray photoelectron spectroscopy, neutron activation analysis and static secondary ion mass spectrometryPolymer, 1989
- An x-ray photoemission spectroscopy study of chemical interactions at silver/plasma modified polyethylene interfaces: Correlations with adhesionJournal of Vacuum Science & Technology A, 1988
- Surface ozonation and photooxidation of polyethylene filmJournal of Polymer Science: Polymer Chemistry Edition, 1983
- An ESCA study of the surface ozonation of polystyrene filmJournal of Polymer Science: Polymer Chemistry Edition, 1982
- Surface modification of polyethylene by electrical discharge treatment and the mechanism of autoadhesionPolymer, 1978