Activity Dips in AT-Cut Crystals

• 1 January 1967
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 420-435
• https://doi.org/10.1109/freq.1967.199681

Abstract

Keywords

• ELECTRONICS PACKAGING
• EQUIVALENT CIRCUITS
• TEMPERATURE
• COUPLING CIRCUITS
• CRYSTALLINE MATERIALS
• STRAIN MEASUREMENT
• RESONANCE
• RESONANT FREQUENCY
• CRYSTALS
• TELEPHONY