Abstract
This is a preliminary report of an examination of the anelasticity and frequency-temperature behavior of synthetic quartz resonators, vibrating in thickness shear at low temperatures. The stress-induced relaxation absorption occurring at 50°K for a frequency of vibration of 5 Mc/sec in natural quartz is found to be three orders of magnitude larger in some samples of the synthetic quartz. The magnitude of the 50°K absorption is dependent upon the crystallographic orientation of the seed plate upon which the quartz is grown.

This publication has 1 reference indexed in Scilit: