A Method of Detecting Hot Spots on Semiconductors using Liquid Crystals

1 April 1981

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE) in 8th Reliability Physics Symposium

No. 07350791,p. 130-133
https://doi.org/10.1109/irps.1981.362984

Abstract

This paper presents a failure analysis technique which uses cholesteric liquid crystals and polarized light to locate areas of high power dissipation on an integrated circuit. The technique is non-destructive and can be performed in a few minutes using common failure analysis equipment. An example is given involving the analysis of a CMOS latch-up mechanism.

Keywords

LIQUID CRYSTALS
OPTICAL POLARIZATION
OPTICAL SURFACE WAVES
OPTICAL SCATTERING
CRYSTALLINE MATERIALS
FAILURE ANALYSIS
TEMPERATURE DEPENDENCE
MONOLITHIC INTEGRATED CIRCUITS
OPTICAL MICROSCOPY
INTEGRATED CIRCUIT PACKAGING

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