High power failure of superconducting microwave filters: Investigation by means of thermal imaging

Abstract
We have investigated power handling of high‐temperature superconducting microstrip filters employing highly sensitive thermal imaging. At low power, the images show small heating effects localized to areas with high current densities (ΔTT≳Tc). Scanning electron microscopy analysis of this area reveals a flaw in the superconducting material, presumably reducing the local critical current. The maximum power handling of these filters is, therefore, still open to improvement.

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