Characterization of SiC using Synchrotron White Beam X-ray Topography

• 10 May 2000
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 338-342, 431-436
• https://doi.org/10.4028/www.scientific.net/msf.338-342.431

Abstract

Keywords

• DEFECT
• MICROPIPE
• SCREW DISLOCATIONS
• SYNCHROTRON TOPOGRAPHY