Ion‐trap mass spectrometry with an inductively coupled plasma source

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Abstract
A new mass spectrometry technique using an inductively coupled plasma (ICP) ionization source and an ion‐trap mass spectrometer (ITMS) detector is described and evaluated for elemental and isotopic analysis. Initial results obtained with the ICP‐ITMS technique include sub‐ppb detection of bare ions for, most elements, complete destruction of typical polyatomic matrix ions (e.g., CIO+, ArO+, and ArCl+), and effective neutralization of strong Ar+ ion currents. The latter effects allow observation of clearer mass spectra at m/z < 80 and potentially improved detection of ‘problem’ elements in ICP‐MS (e.g., K, Ca, V, Fe, As, and Se). Formation of poly‐oxide and ‐hydroxide ions of metals with high oxide bond strengths were observed and require system modifications to alleviate.

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