Low Temperature Absolute Reflection Measurements of Small Samples
- 1 January 1967
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (1) , 32-33
- https://doi.org/10.1063/1.1720523
Abstract
The design of an optical system for making absolute reflectance measurements on small crystals at liquid helium and room temperature is described. The system permits accurate masking of the samples and, with only one moving component, measures reflectivity without the use of a comparison standard.Keywords
This publication has 1 reference indexed in Scilit:
- The relation of the electrical conductivity in single crystals of rhenium trioxide to the conductivities of Sr2MgReO6 and NaxWO3Journal of Physics and Chemistry of Solids, 1965