Anwendbarkeit der Sekundärionen-Massenspektrometrie (SIMS) zur quantitativen Untersuchung der Korngrenzenfremddiffusion
- 1 January 1981
- book chapter
- Published by Springer Nature
Abstract
No abstract availableThis publication has 15 references indexed in Scilit:
- Techniques for the production of oriented bicrystals and results on specimens prepared by these methodsActa Metallurgica, 1980
- The theory of grain boundary segregation in terms of surface adsorption analoguesMetallurgical Transactions A, 1977
- Correlation effects in grain boundary diffusionSurface Science, 1972
- Grain boundary contributions to transportSurface Science, 1972
- Structure of grain boundariesProgress in Materials Science, 1972
- Exact Solutions of Two Ideal Cases in Grain Boundary Diffusion Problem and the Application to Sectioning MethodJournal of the Physics Society Japan, 1964
- The analysis of grain boundary diffusion measurementsBritish Journal of Applied Physics, 1963
- Lattice and Grain Boundary Diffusion in PolycrystalsTransactions of the Japan Institute of Metals, 1961
- CXXXVIII. Concentration contours in grain boundary diffusionJournal of Computers in Education, 1954
- Calculation of Diffusion Penetration Curves for Surface and Grain Boundary DiffusionJournal of Applied Physics, 1951