Trace Element Analysis Using X-Ray Fluorescence.
- 1 January 1975
- journal article
- research article
- Published by Taylor & Francis in Instrumentation Science & Technology
- Vol. 6 (1) , 1-36
- https://doi.org/10.1080/10739147508543381
Abstract
An x-ray fluorescence system has been designed to make elemental analyses of trace elements in low-Z matrices. It consists of radioisotope exciters, a Si(Li) detector, and a computer-based pulse height analyzer. Qualitative measurements of all elements heavier than phosphorus (Z = 15) and quantitative measurements of all elements heavier than potassium (Z = 19) can be made. For samples fluoresced for 1000 s on 9 mg/cm2 filter paper, the three sigma detection limits range from 10 to 100 ng/cm2. Accuracy is within ±10% and reproducibility is better than 5%. The method often requires no sample preparation and is completely nondestructive. Quantitative information obtained with such a system is useful in monitoring trace element concentrations in air, water, or biological material.Keywords
This publication has 2 references indexed in Scilit:
- X‐ray fluorescence analysis — results of a first round intercomparison studyX-Ray Spectrometry, 1974
- Peak boundary selection in photopeak integration by the method of CovellAnalytical Chemistry, 1972