Biaxially textured yttria stabilized zirconia buffer layers on rotating cylindrical surfaces
- 1 March 1997
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 12 (3) , 593-595
- https://doi.org/10.1557/jmr.1997.0086
Abstract
Biaxially textured yttria stabilized zirconia (YSZ) buffer layers are prepared on rotating cylindrical surfaces by an ion-beam-assisted deposition (IBAD) process. A large fraction of the cylinder surface can be coated at the same time, resulting in an effective deposition rate of 40 nm/h for the whole tube circumference (diameter of the tube 12 mm). The in-plane alignment depends on the total film thickness and the rotation velocity. The best in-plane textures achieved so far with a full width half maximum (FWHM) value of 27° are sufficient for the preparation of YbaCuO films with critical current densities above 105 A cm−2 at 77 K and self-fields.Keywords
This publication has 3 references indexed in Scilit:
- Properties of YBa2Cu3O7−δ thick films on flexible buffered metallic substratesApplied Physics Letters, 1995
- Preparation of biaxially aligned cubic zirconia films on pyrex glass substrates using ion-beam assisted depositionJournal of Applied Physics, 1993
- In-plane aligned YBa2Cu3O7−x thin films deposited on polycrystalline metallic substratesApplied Physics Letters, 1992