A high resolution wire scanner for micron-size profile measurements at the SLC
- 1 January 1989
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 274 (1) , 37-44
- https://doi.org/10.1016/0168-9002(89)90362-8
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Transverse emittance measurement with a rapid wire scanner at the CERN SPSNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1985
- The Multiwire Secondary Emission Monitor and the Emittance Measurement of the AGS BeamIEEE Transactions on Nuclear Science, 1983
- The Emission of Secondary Electrons Under High Energy Positive Ion BombardmentPhysical Review B, 1939
- The Emission of Secondary Electrons from Metals Bombarded with ProtonsPhysical Review B, 1939