Neutral primary beam SIMS analysis of surface layers on glass
- 1 January 1983
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 46, 507-510
- https://doi.org/10.1016/0020-7381(83)80163-6
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Evidence for interdiffusion of hydronium and alkali ions in leached glassesApplied Physics Letters, 1981
- Secondary-Ion Mass-Spectrometry on insulators with neutral primary particlesMicrochimica Acta, 1981
- Reactions between aqueous solutions and glass surfacesJournal of Non-Crystalline Solids, 1980
- Local in-depth analysis of ceramic materials by neutral beam secondary ion mass spectrometryInternational Journal of Mass Spectrometry and Ion Physics, 1980
- Charging of insulators by ion bombardment and its minimization for secondary ion mass spectrometry (SIMS) measurementsJournal of Applied Physics, 1976
- Interdiffusion of hydrogen and alkali ions in a glass surfaceJournal of Non-Crystalline Solids, 1975