Characterization of SiO2 Thin Film Obtained by the Sol-Gel Route from TEOS and Triton X45

Publisher Website

1 October 1995

journal article
Published by American Chemical Society (ACS) in Langmuir

Vol. 11 (10) , 3970-3974
https://doi.org/10.1021/la00010a057

Abstract

No abstract available

Keywords

THIN FILM

Cited by 4 articles