Further Development in SC Cut Crystal Resonator Technology

• 1 January 1982
• conference paper
• Published by Institute of Electrical and Electronics Engineers (IEEE)
• p. 208-214
• https://doi.org/10.1109/freq.1982.200571

Abstract

Keywords

• FREQUENCY
• TEMPERATURE
• BARS
• STANDARDS DEVELOPMENT
• TESTING
• THERMAL STRESSES
• IMPEDANCE
• BLADES
• MANUFACTURING