Abstract
Tobacco etch epidemics, caused by tobacco etch virus (TEV), were monitored in three pepper [Capsicum annuum L.) genotypes over a 3-yr period at two locations in northeast Georgia. The three genotypes were Yolo Wonder B (susceptible), Tambel 2 (moderately resistant), and Asgrow-XPH-5021 (moderately resistant). The effect of host resistance on the development of TEV epidemics was indicated by the following results: 1) final TEV disease incidence was 45% less in resistant genotypes, 2) relative area-under-the-disease-progress curve was 42-68% less in resistant genotypes, 3) apparent infection rate was about 50% less in resistant genotypes, and 4) time for TEV disease incidence to reach 50% was delayed 23-37 days in resistant genotypes. All four methods of quantifying the effect of host resistance on TEV disease progression were highly correlated. The consequence of the rate-reducing resistance in Tambel 2 and Asgrow-XPH-5021 was to increase fruit yield (average of 24%), fruit weight (14%), and number of fruit when compared to susceptible Yolo Wonder B.