Apparatus for Measuring the Hall Effect of Low-Mobility Samples at High Temperatures
- 1 November 1967
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 38 (11) , 1658-1661
- https://doi.org/10.1063/1.1720631
Abstract
An apparatus is described for measuring the Hall effect of low mobility samples at high temperatures. The measuring method is of the double ac type. An alternating current at 510 cps, in conjunction with a low frequency magnetic field at about 2 cps, is used. The use of single or double phase sensitive detection is discussed. A temperature controller with a stability of about 2×10−2 C° at 1000°C and a sample holder assembly are described. Results of measurements on NiO samples are given, indicating a noise level equivalent to mobilities of 3×10−4 cm2/V sec.Keywords
This publication has 4 references indexed in Scilit:
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- Hall Effect on Some of the Magnetic CompoundsJournal of the Physics Society Japan, 1961
- Alternate Current Apparatus for Measuring the Ordinary Hall Coefficient of Ferromagnetic Metals and SemiconductorsReview of Scientific Instruments, 1958
- A New Method for the Measurement of Hall CoefficientsReview of Scientific Instruments, 1950