Optical spectroscopy of semiconductor surfaces
- 31 January 1990
- journal article
- Published by Elsevier in Materials Science and Engineering: B
- Vol. 5 (2) , 177-182
- https://doi.org/10.1016/0921-5107(90)90051-c
Abstract
No abstract availableFunding Information
- Ministerul Educaţiei Naţionale
This publication has 32 references indexed in Scilit:
- Polarization dependence of optical transitions in GaP(1 1 0) and GaAs(1 1 0) surfaces studied with surface differential reflectivitySolid State Communications, 1987
- Polarization-dependent reflectivity of Si(111)-(2×1) surface above the gapPhysical Review B, 1985
- Polarization dependent reflectivity of SI(111)-2X1 calculations and comparison with experimentSolid State Communications, 1984
- Differential Reflectivity of Si(111)2×1 Surface with Polarized Light: A Test for Surface StructurePhysical Review Letters, 1984
- Reflectometric study of surface states and oxygen adsorption on clean Si(100) and (110) surfacesSurface Science, 1980
- Surface states in Si(111)2×1 and Ge(111)2×1 by optical reflectivitySolid State Communications, 1980
- Reflectometric study of dangling-bond surface states and oxygen adsorption on the clean Si(111)7 × 7 surfaceSurface Science, 1979
- Surface states on Si (111) 2 × 1 detected by external reflectivitySolid State Communications, 1978
- Optical Absorption of Surface States in Ultrahigh Vacuum Cleaved (111) Surfaces of Ge and SiPhysical Review B, 1971
- Optical Detection of Surface States on Cleaved (111) Surfaces of GePhysical Review Letters, 1968