Application of high voltage electron microscopy to low‐temperature radiation damage studies in metals
- 3 January 1973
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 97 (1-2) , 121-127
- https://doi.org/10.1111/j.1365-2818.1973.tb03766.x
Abstract
SUMMARY: The paper briefly reviews the advantages of high voltage electron microscopy applied to low temperature radiation damage studies. Such studies may be performed inside the microscope provided a high resolution specimen cooling stage is available. The main features of a new type of cooling stage used in the experiments relevant to this paper are outlined. The applicability of the stage for post‐irradiation annealing experiments is emphasized.During electron irradiation to high doses at 8°K the formation of defect clusters was observed in nickel and copper. This is accompanied by pronounced changes in the diffraction pattern. Post‐irradiation annealing of samples irradiated at 8°K produces defect clusters which can be identified as dislocation loops.Keywords
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