i DD , pulse response testing: A unified approach to testing digital and analogue ICs

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Abstract
A test method is presented for detecting defects and fabrication variations in both digital and analogue circuits by simultaneously pulsing the power supply rails and analysing the temporal and/or the spectral characteristics of the resulting transient rail currents. The presented method has a distinct advantage over other forms of iDD testing because it requires a single test vector to excite and expose the presence of a defect or fabrication variations.

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