We present XPS valence band spectra for GaAs (110) and GeSe (001) that have been corrected for coherent loss effects by deconvolution of an instrument/loss function that includes a source function for an unmonochromatized source, a backscattered-electron spectrum to account for energy losses, and an analyzer function. The results are compared with background-subtracted spectra. The deconvolution yields spectra that have significantly greater intensity deep in the band, bringing measurements into closer agreement with theory than is achieved with background subtraction.