Some factors affecting analysis in the atom probe
- 15 April 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 266 (1-3) , 458-462
- https://doi.org/10.1016/0039-6028(92)91061-f
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- An atom probe study of the anomalous field evaporation of alloys containing siliconJournal of Vacuum Science and Technology, 1981
- Field ion image formationSurface Science, 1978
- Investigations of field evaporation with a field-desorption microscopeSurface Science, 1976
- Anomalous fim images of tungstenSurface Science, 1972
- Field evaporation rates of tungstenPhysica Status Solidi (a), 1970