Open-ended metallized ceramic coaxial probe for high-temperature dielectric properties measurements
- 1 June 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 44 (6) , 926-935
- https://doi.org/10.1109/22.506453
Abstract
No abstract availableKeywords
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