A practical approach to testing electronic equipment for susceptibility to AC line transients
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Reliability
- Vol. 37 (4) , 355-359
- https://doi.org/10.1109/24.9838
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- The Propagation and Attenuation of Surge Voltages and Surge Currents in Low-VOltage AC CircuitsIEEE Transactions on Power Apparatus and Systems, 1983