ATOMIC STRUCTURE OF "VITREOUS" INTERFACIAL FILMS IN SIALON

1 October 1988

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 49 (C5) , C5-289
https://doi.org/10.1051/jphyscol:1988534

Abstract

Atomic resolution imaging of siliceous interfacial films in a sialon has been achieved using transmission electron microscopy at 1000 KV. Although such films have always been reputed as vitreous, we show that they are at least partially crystallized. An atomic model is proposed and simulated. The stability of these films is discussed when special crystallographic relationships exist between the two adjacent grains

Keywords

ATOMIC STRUCTURE
VITREOUS
INTERFACIAL FILMS IN SIALON

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