In-situ and ex-situ structural analysis of phospholipid-supported planar bilayers using infrared spectroscopy and atomic force microscopy
- 15 September 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 284-285, 381-386
- https://doi.org/10.1016/s0040-6090(95)08347-2
Abstract
No abstract availableKeywords
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