Determination of current density distribution and constriction resistance in the multiple line contact with various space angles by using conformal mapping
- 1 January 1988
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 11 (3) , 314-317
- https://doi.org/10.1109/33.16658
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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- Effect of Space Angle of Constriction Resistance and Contact Resistance for the Case of Line ContactIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1985
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- Contact Resistance Determination by a Point-Slope MethodIEEE Transactions on Industry and General Applications, 1969
- Electric ContactsPublished by Springer Nature ,1967
- Constriction resistance and the real area of contactBritish Journal of Applied Physics, 1966