Hall-effect studies in deposited CdS thin films

• 1 April 1964
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 52  (4) , 425-426
• https://doi.org/10.1109/PROC.1964.2952

Abstract

Keywords

• SPUTTERING
• HALL EFFECT
• PERFORMANCE EVALUATION
• TEMPERATURE DISTRIBUTION
• IMPURITIES
• THERMAL CONDUCTIVITY
• SCATTERING
• MICROSCOPY
• POWDERS
• ELECTRICAL RESISTANCE MEASUREMENT