Raman scattering studies of monolayer-thickness oxide and tellurium films on PbSnTe
- 28 February 1977
- journal article
- Published by Elsevier in Surface Science
- Vol. 62 (2) , 639-646
- https://doi.org/10.1016/0039-6028(77)90106-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- ESCA surface studies of Pb1−xSnxTe devicesJournal of Vacuum Science and Technology, 1976
- Study of the dielectric function of PbSnTe epitaxial film by far-infrared reflectivityPhysical Review B, 1976
- Raman detection of tellurium layers on surfaces of CdTeSurface Science, 1971
- Raman Spectra and Lattice Dynamics of TelluriumPhysical Review B, 1971
- Surface interaction of H and O2 on thin PbSe epitaxic filmsThin Solid Films, 1971
- The effect of oxygen on epitaxial PbTe, PbSe and PbS filmsThin Solid Films, 1969
- An Electrolytic Polish and Etch for Lead TellurideJournal of the Electrochemical Society, 1962
- Effect of Oxygen on the Electrical Properties of Lead Telluride FilmsPhysical Review B, 1954