Advances in amorphous silicon uncooled IR systems
- 26 July 1999
- proceedings article
- Published by SPIE-Intl Soc Optical Eng
- p. 161-167
- https://doi.org/10.1117/12.354517
Abstract
A new class of uncooled IR systems has been developed based on advances in both amorphous silicon detectors and signal/system processing techniques. Not only are these devices uncooled but they operate over a wide system ambient temperature range without the use of TEC's or choppers. The devices are DC biased and provide radiometric information from each pixel without the use of a calibrated source. The current imaging system are medium to low resolution. They were designed with a very disciplined 'concept-to-cost' technique in which cost, power, sizes, weight and performance were traded off in the stated order. The result has been a new generation of 'ambient temperature' thermal imaging system and radiometers.Keywords
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