Circuit performance characterization of digital 45-nm CMOS technology for applications around 110 GHz
- 1 June 2008
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- No. 21585601,p. 162-163
- https://doi.org/10.1109/vlsic.2008.4585991
Abstract
The first 50-GHz to 110-GHz downconverter in 45-nm digital CMOS is presented along with the mm-wave characterization of AMOS varactors, inductors and transformers. The varactor Q is higher than 6, up to 94 GHz. The downconverter gain is 15 dB at 111GHz, and is employed as a broadband test vehicle to characterize the optimal noise figure current density (JOPT) of 45-nm MOSFETs in the 50 GHz to 110 GHz range.Keywords
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