ELECTRON DIFFRACTION AND LATTICE IMAGE STUDY OF HIGH Jc YBCO AND GBCO THIN FILMS
- 10 October 1990
- journal article
- research article
- Published by World Scientific Pub Co Pte Ltd in Modern Physics Letters B
- Vol. 04 (18) , 1163-1170
- https://doi.org/10.1142/s021798499000146x
Abstract
High resolution electron microscopy observations of YBa 2 Cu 3 O 7 thin films deposited on LaAlO 3 substrate and GdBa 2 Cu 3 O 7 thin films deposited on SrTiO 3 substrate are reported. The microstructure of films with different critical current densities Jc’s are compared. It was found that Jc becomes very high >106 A/cm 2 when the film is epitaxially single crystalline with c-axis perpendicular to the film surface. The effect of grain boundaries and defects in the film on Jc was discussed. The effect of the smoothness, orientation and lattice constants of the substrate on the quality of the deposited film was also discussed.Keywords
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